Effect of defect states at backchannel region on device properties and reliability of a-InGaZnO TFT

Presentation information

Poster presentation

Joint session K » Joint session K

Mon. Sep 16, 2013 1:30 PM - 3:30 PM P8 (Davis Memorial Auditorium)

1:30 PM - 3:30 PM

^○Tatsuya Toda¹, Dapeng Wang¹, Jingxin Jiang¹, Phi Hung Mai¹, Mamoru Furuta¹ (Kochi Univ. of Tech.¹)

Keywords:InGaZnO,TFT