Application of X-ray Talbot imaging for Non-Destructive Inspection of Electronic Products

Presentation information

Poster presentation

01. Applied Physics in General » 1.7 Instrumentation and measurement

Tue. Sep 17, 2013 9:30 AM - 11:30 AM P6 (Davis Memorial Auditorium)

9:30 AM - 11:30 AM

^○Masato Uehara¹, Wataru Yashiro², Atsushi Momose² (AIST¹, Tohoku Univ.²)

Keywords:非破壊検査,X線,産業利用