The 74th JSAP Autumn Meeting,2013

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Poster presentation

01. Applied Physics in General » 1.7 Instrumentation and measurement

[17a-P6-1~11] 1.7 Instrumentation and measurement

Tue. Sep 17, 2013 9:30 AM - 11:30 AM P6 (Davis Memorial Auditorium)

9:30 AM - 11:30 AM

[17a-P6-6] Application of X-ray Talbot imaging for Non-Destructive Inspection of Electronic Products

○Masato Uehara1, Wataru Yashiro2, Atsushi Momose2 (AIST1, Tohoku Univ.2)

Keywords:非破壊検査,X線,産業利用