The 74th JSAP Autumn Meeting,2013

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Symposium planned by Program Committee » Spectroscopic technique for analyzing organic materials and devices

[17p-C6-1~8] Spectroscopic technique for analyzing organic materials and devices

Tue. Sep 17, 2013 1:30 PM - 6:00 PM C6 (TC3 1F-116)

5:00 PM - 5:30 PM

[17p-C6-7] Characterization of Organic Thin Films by Doubly Resonant Sum-Frequency Generation

○Takayuki Miyamae1 (AIST1)

Keywords:和周波発生,有機薄膜,界面