Measurement of Work Function of Hafnium Nitride Films at Elevated Temperature

Presentation information

Oral presentation

07. Beam Technology and Nanofabrication » 7.7 Vacuum nanoelectronics and electron sources

Wed. Sep 18, 2013 9:15 AM - 12:00 PM A13 (TC1 3F-323)

9:45 AM - 10:00 AM

^○Sho Fujiwara¹, Susumu Hogyoku¹, Hiroshi Tsuji¹, Yasuhito Gotoh¹ (Kyoto Univ.¹)

Keywords:仕事関数,電子源