[18a-C4-1~15] 12.8 OLED

[18a-C4-5] X-ray reflectivity analysis for determining the mass densities and packing coefficients of vacuum-deposited amorphous organic semiconductor films

^○Maki Shibata¹, Saki Suzuki², Hiroki Muraoka³, Satoshi Ogawa³, Daisuke Yokoyama^1,2,4 (Dep. of Org. Device Engineer., Yamagata Univ.¹, Dep. of Polym. Sci. and Engineer., Yamagata Univ.², Dep. of Chem. and Bioengineer., Iwate Univ.³, Research Center for Organic Electronics, Yamagata Univ.⁴)

Keywords:密度,X線反射率,有機EL