The 74th JSAP Autumn Meeting,2013

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Oral presentation

13. Semiconductors A (Silicon) » 13.2 Semiconductor surfaces

[18p-C1-1~13] 13.2 Semiconductor surfaces

Wed. Sep 18, 2013 1:00 PM - 4:30 PM C1 (TC3 1F-101)

1:45 PM - 2:00 PM

[18p-C1-4] Real-time Scanning Tunneling Microscopy Observation of Ni Ion Irradiation Process on Si (111) Surface

○Kotaro Mura1, Takefumi Kamioka2, Tetsu Kitani1, Kenta Imazu1, Takanobu Watanabe1 (Waseda Univ.1, TTI2)

Keywords:scanning tunneling microscope,nickel silicide