The 74th JSAP Autumn Meeting,2013

Presentation information

Oral presentation

06. Thin Films and Surfaces » 6.3 Oxide-based electronics

[18p-D3-1~17] 6.3 Oxide-based electronics

Wed. Sep 18, 2013 2:00 PM - 7:00 PM D3 (MK 2F-201)

4:00 PM - 4:15 PM

[18p-D3-8] Effects of hydrogen impurity to electron and mass transport behavior in tin dioxide

Naoki Ohashi1,2,3, Ken Watanabe1, Isao Sakaguchi1,3, Yutaka Adachi1, Shunichi Hishita1, Ryosuke Takahashi1,3, Oliver Bierwagen4,5, James Speck4, Hajime Haneda1, Alex Brian1 (NIMS1, TIES, Tokyo Tech.2, ASEM, Kyushu Univ.3, UCSB4, PDI-Berlin5)

Keywords:酸化スズ,水素,導電性