The 74th JSAP Autumn Meeting,2013

Presentation information

Oral presentation

08. Plasma Electronics » 8.2 Plasma measurements and diagnostics

[19a-C1-1~11] 8.2 Plasma measurements and diagnostics

Thu. Sep 19, 2013 9:00 AM - 12:00 PM C1 (TC3 1F-101)

9:30 AM - 9:45 AM

[19a-C1-3] Characteristic Impedance Monitoring Method for Fault Detection in Plasma Production Line

Taisei Motomura1, Yuji Kasashima1, Osamu Fukuda1, Fumihiko Uesugi1, Hiroyuki Kurita2, Naoya Kimura2 (MSRC, AIST1, ADVANTEST Corporation2)

Keywords:プラズマプロセス,インピーダンス,プロセスモニタリング