[19a-C14-1~9] 3.7 Nano-optics

[19a-C14-2] High resolution imaging by optical near-field microscopy using force detection

^○Takashi Tokuyama¹, Junsuke Yamanishi¹, Yoshitaka Naitoh¹, Yan Jun Li¹, Yasuhiro Sugawara¹ (Osaka Univ.¹)

Keywords:近接場光