The 74th JSAP Autumn Meeting,2013

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Oral presentation

06. Thin Films and Surfaces » 6.6 Probe microscopy

[19a-D2-1~15] 6.6 Probe microscopy

Thu. Sep 19, 2013 9:00 AM - 1:00 PM D2 (MK 1F-102)

9:30 AM - 9:45 AM

△ [19a-D2-3] Investigation of local electrical properties of organic field-effect transistors by frequency-modulation scanning impedance microscopy

○Tomoharu Kimura1, Kei Kobayashi2, Hirofumi Yamada1 (Dept. of Electronic Sci. & Eng., Kyoto Univ.1, Hakubi Center, Kyoto Univ.2)

Keywords:有機薄膜トランジスタ,走査インピーダンス顕微鏡