[19a-D2-1~15] 6.6 Probe microscopy

△ [19a-D2-5] Revealing resistive switching mechanism in NiO by combeining band excitation electrochemical strain microscopy and I-V mapping

^○(D)Issei Sugiyama¹, Naoya Shibata¹, Takahisa Yamamoto^1,2,3, Yuichi Ikuhara^1,2,4 (Tokyo Univ.¹, JFCC², Nagoya Univ.³, Tohoku Univ.⁴)

Keywords:走査プローブ顕微鏡,電気化学歪み顕微鏡,走査透過型電子顕微鏡