[19a-P3-1~27] 6.3 Oxide-based electronics

[19a-P3-11] Examination of Oxidize Al Underlayer for SrAl2O4: Eu, Dy Thin Films by Annealing Method

^○Makoto Kitada¹, Kazuaki Kobayashi¹, Hidehiko Shimizu¹, Haruo Iwano¹, Yasuo Hukushima¹, Takahiro Kawakami¹ (Niigata Univ.¹)

Keywords:アルミン酸ストロンチウム薄膜,熱処理,下地膜