The 74th JSAP Autumn Meeting,2013

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14. Semiconductors B (Exploratory Materials, Physical Properties, Devices) » 14.3 Electron devices and Process technology

[19a-P7-1~14] 14.3 Electron devices and Process technology

Thu. Sep 19, 2013 9:30 AM - 11:30 AM P7 (Davis Memorial Auditorium)

9:30 AM - 11:30 AM

[19a-P7-1] Characterization of traps in high-resistivity GaN

○Yutaka Tokuda1, Takeshi Tanaka2,3, Shiojima Kenji2, Otoki Yohei3 (Aichi Inst. of Technol.1, Univ. of Fukui2, Hitachi Cable3)

Keywords:半導体