9:30 AM - 11:30 AM
△ [19a-P7-3] Mapping evaluation of n-GaN Schottky diodes using scanning internal photoemission microscopy
Keywords:顕微光応答法,n-GaN,ショットキー
Poster presentation
14. Semiconductors B (Exploratory Materials, Physical Properties, Devices) » 14.3 Electron devices and Process technology
Thu. Sep 19, 2013 9:30 AM - 11:30 AM P7 (Davis Memorial Auditorium)
9:30 AM - 11:30 AM
Keywords:顕微光応答法,n-GaN,ショットキー