The 74th JSAP Autumn Meeting,2013

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Oral presentation

06. Thin Films and Surfaces » 6.6 Probe microscopy

[19p-D2-1~15] 6.6 Probe microscopy

Thu. Sep 19, 2013 2:30 PM - 6:30 PM D2 (MK 1F-102)

2:30 PM - 2:45 PM

[19p-D2-1] Influence of charged samples on Scanning Ion Conductance Microscopy

○Kimihiro Ishizaki1, Tatsuo Ushiki2, Masato Nakajima2, Futoshi Iwata1 (Shizuoka Univ.1, Nigata Univ.2)

Keywords:走査型イオン伝導顕微鏡