The 74th JSAP Autumn Meeting,2013

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Oral presentation

06. Thin Films and Surfaces » 6.6 Probe microscopy

[19p-D2-1~15] 6.6 Probe microscopy

Thu. Sep 19, 2013 2:30 PM - 6:30 PM D2 (MK 1F-102)

5:00 PM - 5:15 PM

[19p-D2-10] Site specific surface potential measurement on Si(111)-(7×7) surface using noncontact scanning nonlinear dielectric microscopy

○Kohei Yamasue1, Masayuki Abe2, Yoshiaki Sugimoto3, Yasuo Cho1 (Tohoku Univ.1, Nagoya Univ.2, Osaka Univ.3)

Keywords:走査型非線形誘電率顕微鏡,SNDM,Si