[19p-D2-1~15] 6.6 Probe microscopy

[19p-D2-8] Atomic resolution imaging of the local contact potential difference with kelvin probe force microscopy without the dc bias voltage

^○(M1)Ryosuke Kanbayashi¹, Lili Kou¹, Yoshitaka Naitoh¹, YanJun Li¹, Yasuhiro Sugawara¹ (Osaka Univ.¹)

Keywords:ケルビンプローブ力顕微鏡,局所接触電位差