The 74th JSAP Autumn Meeting,2013

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Oral presentation

06. Thin Films and Surfaces » 6.6 Probe microscopy

[19p-D2-1~15] 6.6 Probe microscopy

Thu. Sep 19, 2013 2:30 PM - 6:30 PM D2 (MK 1F-102)

4:45 PM - 5:00 PM

[19p-D2-9] Evaluation of alumina thin film by measuring contact potential deference

○(M2)Yuta Ashida1, Hirotaka Yokoyama1, Yoshitaka Naitoh1, Yan jun Ri1, yasuhiro Sugawara1 (Osaka Univ.1)

Keywords:アルミナ