1:30 PM - 3:30 PM
[19p-P3-1] Evaluation of two-dimensional device-error-redundant single-electron oscillator system(2)
Keywords:単電子,確率共鳴現象,ノイズ
Poster presentation
09. Applied Materials Science » 9.3 Nanoelectronics
Thu. Sep 19, 2013 1:30 PM - 3:30 PM P3 (Davis Memorial Auditorium)
1:30 PM - 3:30 PM
Keywords:単電子,確率共鳴現象,ノイズ