[19p-P3-1~6] 9.3 Nanoelectronics

[19p-P3-4] Integration of Series-Connected 30 Ni Nanogaps by Field-Emission-Induced Electromigration

^○Akihiro Hirata¹, Mitsuki Ito¹, Takahiro Toyonaka¹, Jun-ichi Shirakashi¹ (Tokyo Univ. Agr. & Tech.¹)

Keywords:エレクトロマイグレーション,ナノギャップ,集積化