○Daiki Hatanaka1, Imran Mahboob1, Koji Onomitsu1, Hiroshi Yamaguchi1 (NTT Basic Research Laboratories1)
Session information
Regular sessions(Oral presentation)
14. Semiconductors B (Exploratory Materials, Physical Properties, Devices) » 14.2 Ultrathin films and quantum nanostructures
[30a-G20-1~15] 14.2 Ultrathin films and quantum nanostructures
Sat. Mar 30, 2013 9:00 AM - 1:00 PM G20 (B5 4F-2404)
△:Young Scientist Oral Presentation Award Applied
▲:English Presentation
▼:Both Award Applied and English Presentation
○Hajime Okamoto1, Ahmet Taspinar1, Imran Mahboob1, Hiroshi Yamaguchi1 (NTT Basic Research Labs.1)
○Tetsu Ito1, Hideki Gotoh2, Masao Ichida3, Hiroaki Ando3 (GRL Shizuoka Univ.1, NTT BRL2, Grad. Sch. of Nat. Sci. Konan Univ.3)
○Keita Imai1, Tosio Kastuyama1, Shin-ichiro Gozu2, Teruo Mozume2 (Fukui Univ.1, AIST2)
○Weiguo Hu1,2, Makoto Igarashi1,2, Mohd Erman Fauzi1,2, Akio Higo4, Ming-Yi Lee3, Yiming Li3,4, Seiji Samukawa1,2,4 (IFS, Tohoku Univ.1, JST-CREST2, National Chiao Tung Univ.3, WPI-AIMR, Tohoku Univ.4)
○Cédric Thomas1,3, Yosuke Tamura1,3, Makoto Igarashi1,3, Mohd Erman Fauzi1,3, Akio Higo2, Weiguo Hu1,3, Tomohiro Kubota1, Seiji Samukawa1,2,3 (IFS, Tohoku Univ.1, WPI-AIMR, Tohoku Univ.2, JST-CREST3)
○Yosuke Tamura1,2, Makoto Igarashi1,2, Cédric Thomas1,2, Mohd Erman Fauzi1,2, Weiguo Hu1,2, Akio Higo3, Rikako Tsukamoto1,2, Toshiyuki Kaizu2,4, Takuya Hoshii2,5, Takayuki Kiba2,6, Ichiro Yamashita2,7, Yoshitaka Okada2,5, Akihiro Murayama2,6, Seiji Samukawa1,2,3 (IFS, Tohoku Univ1, JST-CREST2, WPI-AIMR, Tohoku Univ.3, Kobe Univ.4, RCAST, Univ. of Tokyo5, IST, Hokkaido Univ.6, NAIST7)
○Takayuki Kiba1,6, Kenta Suzaki1, Yosuke Tamura2,6, Makoto Igarashi2,6, Cedric Thomas2,6, Weiguo Wu2,6, Toshiyuki Kaizu3,6, Yoshitaka Okada4,6, Seiji Samukawa2,5,6, Akihiro Murayama1,6 (Graduate School of IST, Hokkaido Univ.1, Inst. of Fluid Science, Tohoku Univ.2, Graduate School of Eng., Kobe Univ.3, RCAST, Univ. of Tokyo4, WPI-AIMR Tohoku Univ.5, JST-CREST6)
○Mohd Erman Fauzi1,5, Yosuke Tamura1,5, Akio Higo2, Yunpeng Wang3, Masakazu Sugiyama4, Yoshiaki Nakano3, Seiji Samukawa1,2,5 (IFS, Tohoku Univ.1, WPI-AIMR, Tohoku Univ.2, RCAST, Univ. of Tokyo3, School of Eng., Univ. of Tokyo4, JST-CREST5)
○Weiguo Hu1,2, Makoto Igarashi1,2, Mohd Erman Fauzi1,2, Akio Higo4, Ming-Yi Lee3, Yiming Li3,4, Seiji Samukawa1,2,4 (IFS, Tohoku Univ.1, JST-CREST2, National Chiao Tung Univ.3, WPI-AIMR, Tohoku Univ.4)
○Mohd Erman Fauzi1,4, Makoto Igarashi1,4, Weiguo Hu1,4, Yosuke Tamura1,4, Akira Wada1, Ichiro Yamashita3, Seiji Samukawa1,2,4 (IFS, Tohoku Univ.1, WPI-AIMR, Tohoku Univ.2, NAIST3, JST-CREST4)
○Hidetada Komatsu1, Yoshinori Nakagawa1,2, Ken Morita1, Takahiro Kitada1, Toshirou Isu1 (Tokushima Univ.1, NICHIA Corp.2)
○Guodong Hao1, XueLun Wang1 (National Institute of Advanced Industrial Science and Technology (AIST)1)
○Yusuke Kumazaki1, Akio Watanabe1, Ryouhei Jinbo1, Zenji Yatabe1, Taketomo Sato1 (RCIQE, Hokkaido Univ.1)
○Ibuki Kawamura1, Kenji Imakita1, Minoru Fujii1 (Kobe Univ.1)