[27a-PB2-3] △Effect of Deposition Angle on Reset Switching Characteristics in ReRAM Prepared by Using Glancing Angle Deposition
Keywords:ReRAM、斜め堆積法、NiO
Regular sessions(Poster presentation)
06. Thin Films and Surfaces » 6.3 Oxide-based electronics
Wed. Mar 27, 2013 9:30 AM - 11:30 AM PB2 (2nd gymnasium)
Keywords:ReRAM、斜め堆積法、NiO