The 60th JSAP Spring Meeting,2013

Presentation information

Regular sessions(Poster presentation)

06. Thin Films and Surfaces » 6.3 Oxide-based electronics

[27a-PB2-1~24] 6.3 Oxide-based electronics

Wed. Mar 27, 2013 9:30 AM - 11:30 AM PB2 (2nd gymnasium)

[27a-PB2-3] △Effect of Deposition Angle on Reset Switching Characteristics in ReRAM Prepared by Using Glancing Angle Deposition

Yusuke Sawai1, Kenntarou Kinosita1,2, Takahiro Fukuhara1, Satoru Kishida1,2 (Tottori Univ.1, Tottori Univ. Electronic Display Research Center2)

Keywords:ReRAM、斜め堆積法、NiO