The 60th JSAP Spring Meeting,2013

Presentation information

Regular sessions(Oral presentation)

03. Optics » 3.4 Optical measurement

[27p-A2-1~14] 3.4 Optical measurement

Wed. Mar 27, 2013 1:30 PM - 5:15 PM A2 (K1 B1-B102)

[27p-A2-11] Inspection of metallization process by differential reflection spectral measurements at plasma edges

Teppei Onuki1, Hiroki Kuwano2 (Ibaraki Univ.1, Tohoku Univ.2)

Keywords:配線膜、プラズマ端、反射分光