[27p-F2-1~15] 6.3 Oxide-based electronics

[27p-F2-2] △Observation of local redox reactions in unipolar resistive switching memory devices

^○Kohei Fujiwara^1,2, Koji Horiba^3,4,5, Naoka Nagamura^4,5, Masaharu Oshima^4,5, Hidenori Takagi^2,6 (ISIR¹, RIKEN², KEK³, SRRO⁴, Univ. of Tokyo⁵, Univ. of Tokyo⁶)

Keywords:ReRAM