The 60th JSAP Spring Meeting,2013

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Regular sessions(Oral presentation)

06. Thin Films and Surfaces » 6.3 Oxide-based electronics

[27p-F2-1~15] 6.3 Oxide-based electronics

Wed. Mar 27, 2013 1:30 PM - 5:30 PM F2 (E3 3F-303)

[27p-F2-3] △Atmosphere dependence of memory characteristics in NiO-ReRAM

○Ryosuke Ogata1, Kentaro Kinoshita1,2, Masataka Yoshihara1, Satoru Kishida1,2 (Tottori Univ1, Tottori Univ. Electronic Display Research Center2)

Keywords:NiO、ReRAM、雰囲気依存性