[27p-F2-1~15] 6.3 Oxide-based electronics

[27p-F2-5] △Difficulty in Acquirement of Reset Parameters in Filament-type Resistive Memories

^○Takumi Moriyama¹, Kentaro Kinoshita^1,2, Ryosuke Koishi¹, Shigeyuki Tsuruta¹, Satoru Kishida^1,2 (Tottori Univ.¹, Tottori Univ. Electronic Display Research Center²)

Keywords:ReRAM、CB-RAM、リセット