Reliability of the 2Xnm TLC NAND Flash Memory

Presentation information

Regular sessions(Oral presentation)

13. Semiconductors A (Silicon) » 13.6 Silicon devices / Integration technology

Thu. Mar 28, 2013 9:00 AM - 11:45 AM G9 (B5 2F-2203)

^○Yoshihiko Yamane¹, Shogo Hachiya¹, Shuhei Tanakamaru^1,2, Ken Takeuchi¹ (Chuo Univ.¹, Univ of Tokyo.²)

Keywords:NANDフラッシュメモリ、TLC、信頼性評価