The 60th JSAP Spring Meeting,2013

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Regular sessions(Oral presentation)

13. Semiconductors A (Silicon) » 13.6 Silicon devices / Integration technology

[28a-G9-1~11] 13.6 Silicon devices / Integration technology

Thu. Mar 28, 2013 9:00 AM - 11:45 AM G9 (B5 2F-2203)

[28a-G9-3] Reliability Evaluation Results of Unified Solid-State Storage

○Masafumi Doi1, Shuhei Tanakamaru1,2, Ken Takeuchi1 (Chuo Univ.1, Univ. of Tokyo2)

Keywords:NANDフラッシュメモリ、ReRAM、ストレージ