The 60th JSAP Spring Meeting,2013

Presentation information

Regular sessions(Oral presentation)

07. Beam Technology and Nanofabrication » 7.1 X-ray technologies

[28p-B1-1~16] 7.1 X-ray technologies

Thu. Mar 28, 2013 1:30 PM - 5:45 PM B1 (K2 3F-1301)

[28p-B1-14] Three-dimensional elemental mapping by using a full-field X-ray fluorescence imaging microscope of laboratory scale

Junki Hshizume1, Yusuke Imai1, Takashi Oniki1, Norio Watanabe1, Sadao Aoki1 (Tsukuba Univ.1)

Keywords:蛍光X線顕微鏡