The 60th JSAP Spring Meeting,2013

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Regular sessions(Oral presentation)

07. Beam Technology and Nanofabrication » 7.1 X-ray technologies

[28p-B1-1~16] 7.1 X-ray technologies

Thu. Mar 28, 2013 1:30 PM - 5:45 PM B1 (K2 3F-1301)

[28p-B1-6] △Power Load test of Multiline Embedded X-ray Targets and Fast X-ray Phase-contrast Imaging using a Table-top Talbot-Lau Interferometer

○Sho Fujino1, Naoki Morimoto1, Ken-ichi Ohshima2, Jimpei Harada3, Takuji Hosoi1, Heiji Watanabe1, Takayoshi Shimura1 (Osaka Univ.1, Tsukuba Univ.2, Nagoya Univ.3)

Keywords:Talbot-Lau干渉計、X線、位相イメージング