[28p-B2-4] Problem Solving of Directional Pattern Width Difference in Projection Exposure Using a Four-Line Gradient Index Lens Array
Keywords:屈折率分布型レンズアレイ、走査投影露光、異方性
Regular sessions(Oral presentation)
07. Beam Technology and Nanofabrication » 7.3 Lithography
Thu. Mar 28, 2013 1:30 PM - 5:00 PM B2 (K2 3F-1302)
Keywords:屈折率分布型レンズアレイ、走査投影露光、異方性