The 60th JSAP Spring Meeting,2013

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Regular sessions(Oral presentation)

01. Applied Physics in General » 1.7 Instrumentation and measurement

[28p-B7-6~13] 1.7 Instrumentation and measurement

Thu. Mar 28, 2013 3:00 PM - 5:00 PM B7 (K2 4F-1403)

[28p-B7-7] Observation of Film Adhesion Defect using Transient Thermal Behavior III

○Minoru Aoyagi1, Yuichi Mitsuma1, Makoto Okuda1 (Nippon Institute of Technology1)

Keywords:赤外線、非破壊検査