[28p-B9-1~10] 9.3 Nanoelectronics

[28p-B9-10] Investigation of Relation between Field-Emission-Induced Electromigration Steps and Electrical Properties of Single-Electron Transistors

^○Shunsuke Akimoto¹, Ryutaro Suda¹, Masazumi Ando¹, Kohei Morihara¹, Jun-ichi Shirakashi¹ (Tokyo Univ. Agr. & Tech.¹)

Keywords:単電子トランジスタ、ナノギャップ、エレクトロマイグレーション