The 60th JSAP Spring Meeting,2013

Presentation information

Regular sessions(Oral presentation)

14. Semiconductors B (Exploratory Materials, Physical Properties, Devices) » 14.3 Electron devices and Process technology

[28p-G11-1~18] 14.3 Electron devices and Process technology

Thu. Mar 28, 2013 2:00 PM - 6:45 PM G11 (B5 2F-2205)

[28p-G11-1] Analysis of Breakdown Voltage Enhancement in AlGaN/GaN HEMTs with a High-k Passivation Layer

Hideyuki Hanawa1, Atsushi Nakajima1, Kazushige Horio1 (Shibaura Inst. Tech.1)

Keywords:GaN、HEMT、耐圧