[28p-G22-12] Determination of stacking structure of 10H-SiC by Raman scattering measurements and Raman intensity calculation
Keywords:SiC、ラマン散乱
Regular sessions(Oral presentation)
15. Crystal Engineering » 15.6 IV-group-based compounds
Thu. Mar 28, 2013 1:45 PM - 6:45 PM G22 (B5 4F-2406)
Keywords:SiC、ラマン散乱