[28p-PB2-5] Characterization of junctions and grains in BaSi2 thin film grown on Si(111) substrate by probe-EBIC technique
Keywords:EBIC、BaSi2
Regular sessions(Poster presentation)
14. Semiconductors B (Exploratory Materials, Physical Properties, Devices) » 14.1 Physical properties of exploratory materials
Thu. Mar 28, 2013 4:00 PM - 6:00 PM PB2 (2nd gymnasium)
Keywords:EBIC、BaSi2