[28p-PB2-1~10] 14.1 Physical properties of exploratory materials

[28p-PB2-5] Characterization of junctions and grains in BaSi₂ thin film grown on Si(111) substrate by probe-EBIC technique

^○（P）Kentaro Watanabe^1,2, Masakazu Baba¹, Takashi Sekiguchi^1,2, Hisanori Yamane³, Takashi Suemasu¹ (Univ. of Tsukuba¹, NIMS², Tohoku Univ.³)

Keywords:EBIC、BaSi2