The 60th JSAP Spring Meeting,2013

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Regular sessions(Oral presentation)

06. Thin Films and Surfaces » 6.6 Probe microscopy

[29p-D3-1~20] 6.6 Probe microscopy

Fri. Mar 29, 2013 1:30 PM - 6:45 PM D3 (C5 3F-324)

[29p-D3-1] △Development of UHV nc-AFM using a quartz tuning fork for force sensor

○（M2）Hiroaki Ooe1, Toyoko Arai1 (Kanazawa Univ.1)

Keywords:nc-AFM