The 60th JSAP Spring Meeting,2013

Presentation information

Regular sessions(Oral presentation)

06. Thin Films and Surfaces » 6.6 Probe microscopy

[29p-D3-1~20] 6.6 Probe microscopy

Fri. Mar 29, 2013 1:30 PM - 6:45 PM D3 (C5 3F-324)

[29p-D3-13] An all-optic UHV atomic force microscopy for chemical identification working in lateral mode.

○(P)Denis Damiron1,2, Othman Mohammad1, Yohei Toriyama1, Pierre Allain1,2, Dai Kobayashi1, Hideki Kawakatsu1 (IIS Tokyo Univ.1, LIMMS2)

Keywords:AFM、UHV、化学的同定法