[29p-D3-13] An all-optic UHV atomic force microscopy for chemical identification working in lateral mode.
Keywords:AFM、UHV、化学的同定法
Regular sessions(Oral presentation)
06. Thin Films and Surfaces » 6.6 Probe microscopy
Fri. Mar 29, 2013 1:30 PM - 6:45 PM D3 (C5 3F-324)
Keywords:AFM、UHV、化学的同定法