X-ray Aided Noncontact Atomic Force Microscopy (XANAM) by using a qPlus sensor

Presentation information

Regular sessions(Oral presentation)

06. Thin Films and Surfaces » 6.6 Probe microscopy

Fri. Mar 29, 2013 1:30 PM - 6:45 PM D3 (C5 3F-324)

^○Suzuki Shushi¹, Mukai Shingo², Wang-Jae Chun³, Nomura Masaharu⁴, Asakura Kiyotaka² (Nagoya Univ.¹, Hokkaido Univ.², ICU³, KEK-PF⁴)

Keywords:X-ray Aided Noncontact Atomic Force Microscopy、qPlus sensor、Elemental analysis