The 60th JSAP Spring Meeting,2013

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Regular sessions(Oral presentation)

06. Thin Films and Surfaces » 6.6 Probe microscopy

[29p-D3-1~20] 6.6 Probe microscopy

Fri. Mar 29, 2013 1:30 PM - 6:45 PM D3 (C5 3F-324)

[29p-D3-6] Tip surface modification for high-resolution AFM measurements in liquid

○Hironori Nakayachi1, Hitoshi Asakawa2, Takeshi Fukuma1,2 (Division of Electrical Eng. & Computer Sci., Kanazawa Univ.1, Bio-AFM FRC, Kanazawa Univ.2)

Keywords:原子間力顕微鏡、探針表面処理