[29p-F2-1~19] 6.3 Oxide-based electronics

[29p-F2-10] Control of oxygen-ions diffusion during the reduction of CaFeO_2.5 thin films with a LaAlO₃ cap layer

^○Noriaki Murakami¹, Daisuke Kan¹, Noriya Ichikawa¹, Yuichi Shimakawa^1,2 (ICR,Kyoto Univ.¹, JST-CREST²)

Keywords:薄膜、還元、酸素イオン