[29p-PA9-1~23] 16.3 Bulk, thin-film and other silicon-based solar cells

[29p-PA9-3] Carrier Concentration Profiling on Pyramid Texture Surface: Calibration of Electrochemical Capacitance Voltage using Scanning Electron Microscopy

^○Yuji Komatsu¹, Daisuke Harata^1,2, Erik W. Schuring¹, Ard H.G. Vlooswijk³, Shigetaka Katori², Shizuo Fujita², Ilkay Cesar¹ (ECN (NL)¹, Kyoto Univ.², Tempress (NL)³)

Keywords:ECV、テクスチャ、エミッタ