The 60th JSAP Spring Meeting,2013

Presentation information

Regular sessions(Poster presentation)

13. Semiconductors A (Silicon) » 13.4 Interconnection technology

[29p-PB2-1~3] 13.4 Interconnection technology

Fri. Mar 29, 2013 1:30 PM - 3:30 PM PB2 (2nd gymnasium)

[29p-PB2-3] Size Dependence of the resisitivity of Ni silicide Nanowire formed by 2step annealing process

Jinhan Song1, Kazuki Matsumoto1, Kuniyuki Kakushima2, Ahmet Parhat1, Yoshinori Kataoka2, Akira Nishiyama2, Nobuyuki Sugii2, Kazuo Tsutsui2, Kenji Natori1, Takeo Hattori1, Hiroshi Iwai1 (Tokyo Tech. FRC1, Tokyo Tech. IGSSE2)

Keywords:Nanowire