The 60th JSAP Spring Meeting,2013

Presentation information

Regular sessions(Poster presentation)

13. Semiconductors A (Silicon) » 13.7 Simulation

[29p-PB3-1~6] 13.7 Simulation

Fri. Mar 29, 2013 1:30 PM - 3:30 PM PB3 (2nd gymnasium)

[29p-PB3-2] Characteristic analysis of tunnel FET based on multiband envelope function method

○(M1)Hiroto Nagai1, Takashi Nakano1, Yasuaki Miyoshi1, Matsuto Ogawa1, Satofumi Souma1 (Kobe Univ.1)

Keywords:トンネル電界効果トランジスタ、多バンド有効質量近似法