[30a-D3-1~13] 6.6 Probe microscopy

[30a-D3-6] Measurement of contact potential difference on line defects of alumina thin film

^○（M1）Yuta Ashida¹, Rintaro Doi¹, Yoshitaka Naitoh¹, Yanjun Ri¹, Yasuhiro Sugawara¹ (Osaka Univ¹)

Keywords:アルミナ