The 60th JSAP Spring Meeting,2013

Presentation information

Regular sessions(Oral presentation)

06. Thin Films and Surfaces » 6.6 Probe microscopy

[30a-D3-1~13] 6.6 Probe microscopy

Sat. Mar 30, 2013 9:00 AM - 12:30 PM D3 (C5 3F-324)

[30a-D3-8] In situ observation of graphite electrode surface by using electrochemical frequency modulation atomic force microscopy (EC-FM-AFM)

Toru Utsunomiya1, Yasuyuki Yokota1, Toshiaki Enoki2, Ken-ichi Fukui1 (Osaka Univ.1, Tokyo Tech.2)

Keywords:グラファイト、原子間力顕微鏡