Symposium

Symposium » Phase problem in the analysis of buried interfaces by X-ray reflectivity andsurface X-ray scattering - Towards new research with coherent light sources

[17p-A13-1~6] Phase problem in the analysis of buried interfaces by X-ray reflectivity andsurface X-ray scattering - Towards new research with coherent light sources

Wed. Sep 17, 2014 1:45 PM - 4:30 PM A13 (E304)

△：Young Scientist Oral Presentation Award Applied
▲：English Presentation
▼：Both Award Applied and English Presentation

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Lunch 12:15～13:45 (12:15 PM - 1:45 PM)

1:45 PM - 2:00 PM

[17p-A13-1] Time-resolved x-ray diffraction study of Pr_0.5Ca_0.5MnO₃ thin films by XFEL

^○Hiroki Wadati¹, Paul Beaud^2,3, Andrin Caviezel², Simon Mariager², Laurenz Rettig², Gerhard Ingold³, Christian Dornes⁴, Shin Wen Huang², J. A. Johnson², Milan Radovic², Thomas Huber⁴, Teresa Kubacka⁴, Andres Ferrer^2,4, Henrik Lemke⁵, Matthieu Chollet⁵, Diling Zhu⁵, James Glownia⁵, Marcin Sikorski⁵, Aymeric Robert⁵, Masao Nakamura⁶, Masashi Kawasaki^1,6, Yoshinori Tokura^1,6, Steven Johnson⁴, Urs Staub² (Univ. of Tokyo¹, SLS², SwissFEL³, ETH⁴, LCLS⁵, IKEN CEMS⁶)

2:00 PM - 2:15 PM

▲ [17p-A13-2] Tomographic Micro-Imaging of Buried Layers and Interfaces with 15W X-ray Power Source

^〇(D)Jinxing Jiang^1,2, Kenji Sakurai^1,2 (University of Tsukuba¹, National Institute for Materials Science²)

2:15 PM - 2:45 PM

[17p-A13-3] The treatment of the coherent ingredient in the X-ray reflectivity analysis

^○Yoshikazu Fujii¹ (Kobe Univ.¹)

Break 14:45～15:00 (2:45 PM - 3:00 PM)

3:00 PM - 3:30 PM

[17p-A13-4] Possibility of X-ray phase imaging in reciprocal space with X-ray grating interferometer

^○Wataru Yashiro¹ (IMRAM, Tohoku Univ.¹)

3:30 PM - 4:00 PM

[17p-A13-5] Direct methods of X-ray CTR scattering structure analysis and their application to topological insulator interfaces

^○Tetsuroh Shirasawa^1,2 (ISSP, Univ. of Tokyo¹, JST, PRESTO²)

4:00 PM - 4:30 PM

Session information

[17p-A13-1~6] Phase problem in the analysis of buried interfaces by X-ray reflectivity andsurface X-ray scattering - Towards new research with coherent light sources

[17p-A13-1] Time-resolved x-ray diffraction study of Pr_0.5Ca_0.5MnO₃ thin films by XFEL

▲ [17p-A13-2] Tomographic Micro-Imaging of Buried Layers and Interfaces with 15W X-ray Power Source

[17p-A13-3] The treatment of the coherent ingredient in the X-ray reflectivity analysis

[17p-A13-4] Possibility of X-ray phase imaging in reciprocal space with X-ray grating interferometer

[17p-A13-5] Direct methods of X-ray CTR scattering structure analysis and their application to topological insulator interfaces

[17p-A13-6] Discussion

Session information

[17p-A13-1~6] Phase problem in the analysis of buried interfaces by X-ray reflectivity andsurface X-ray scattering - Towards new research with coherent light sources

[17p-A13-1] Time-resolved x-ray diffraction study of Pr0.5Ca0.5MnO3 thin films by XFEL

▲ [17p-A13-2] Tomographic Micro-Imaging of Buried Layers and Interfaces with 15W X-ray Power Source

[17p-A13-3] The treatment of the coherent ingredient in the X-ray reflectivity analysis

[17p-A13-4] Possibility of X-ray phase imaging in reciprocal space with X-ray grating interferometer

[17p-A13-5] Direct methods of X-ray CTR scattering structure analysis and their application to topological insulator interfaces

[17p-A13-6] Discussion

[17p-A13-1] Time-resolved x-ray diffraction study of Pr_0.5Ca_0.5MnO₃ thin films by XFEL